Detect when illumination-pupil coupling begins to drift toward loss of critical dimension control.
This dataset maps coherence decay between:
pupil geometrydose distributionprinted wafer metrics
The goal is to identify drift before feature collapse.
Lithography systems rarely fail instantly.They drift.
Early detection prevents yield loss and… See the full description on the dataset page:
https://huggingface.co/datasets/ClarusC64/euv-illumination-pupil-coherence-drift-detection-v0.1.