Goal
Predict failure in stacked 2D devices.
Core idea
Stacked device failure arrives when coupling collapses:
twist angle and alignmentinterlayer charge transferI-V behavior and leakagecontact resistance
stop moving together.
Inputs
twist angle
TEM alignment score
interlayer charge transfer efficiency
contact resistance
I-V nonlinearity index
leakage current
thermal cycles
humidity exposure
interface_coherence_score
decoherence_flag
decoherence_type… See the full description on the dataset page:
https://huggingface.co/datasets/ClarusC64/2d-vdw-interface-decoherence-v0.1.
