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LayerFault/
dependency-clean-pinned-control

Name: dependency-clean-pinned-control
Availability: InStock

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dependency-clean-pinned-control

SECURITY TEST ARTIFACT: DO NOT USE AS A PRODUCTION MODEL

This repository is part of the Layerfault synthetic security corpus. It is deliberately constructed to contain security-relevant characteristics for scanner testing.

Corpus ID: LF-CH-DEPX-0001

Purpose

Dependency clean pinned control.

Direct expected Layerfault rules

None; this repository is a control/comparison input.

Candidate rules

These are deliberately plausible targets that remain marked as candidates until the exact Layerfault build used for certification confirms them.

None

Negative-control rules

These should remain silent for this corpus item.

LF-DEP-VCS-MUTABLE-REF
LF-DEP-ALT-INDEX
LF-DEP-INSTALL-HOOK

Safety

The corpus uses fake secrets, loopback/.invalid network destinations, harmless marker output, and synthetic model behavior only. It is intended for static scanning and isolated security testing.

Challenge classification

Severity: informational
Difficulty: basic
Expected admission decision: PASS
Control type: negative
Attack surface: dependency-supply-chain
Techniques: dependency, control
Transformations: none

Ground-truth oracle IDs

LF-ORACLE-DEPX-0001

These oracle IDs describe synthetic ground truth. They do not claim that a matching Layerfault detector already exists. A challenge may intentionally expose a scanner blind spot and remain unmapped until the detector is implemented.

LayerFault/dependency-clean-pinned-control